A Self-Consistent Full 3-D Real-Space NEGF Simulator for Studying Nonperturbative Effects in Nano-MOSFETs, A. Martinez, M. Bescond, J. R. Barker, A. Svizhenko, M. P. Anantram, C. Millar, and A. Asenov, IEEE Transactions on Electron Devices, Volume 54, Number 9, Pages 2213-2222 (2007)
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